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A High-Efficiency 6.78-MHz Full Active Rectifier with Adaptive Time Delay Control for Wireless Power Transmission

by nexgentech | Oct 24, 2017 | ieee project

A High-Efficiency 6.78-MHz Full Active Rectifier with Adaptive Time Delay Control for Wireless Power Transmission Abstract: This paper presents a full active rectifier consisting of GaN devices and a CMOS controller designed for wireless power transmission in...

Fault Diagnosis Schemes for Low-Energy Block Cipher Midori Benchmarked on FPGA

by nexgentech | Oct 24, 2017 | ieee project

Fault Diagnosis Schemes for Low-Energy Block Cipher Midori Benchmarked on FPGA BULK IEEE VLSI PROJECTS Abstract: Achieving secure high-performance implementations for constrained applications such as implantable and wearable medical devices are a priority in efficient...

A 65-nm CMOS Constant Current Source with Reduced PVT Variation

by nexgentech | Oct 24, 2017 | ieee project

A 65-nm CMOS Constant Current Source with Reduced PVT Variation Abstract: This paper presents a new nanometer-based low-power constant current reference that attains a small value in the total process–voltage–temperature variation. The circuit architecture is based on...

Fast Automatic Frequency Calibrator Using an Adaptive Frequency Search Algorithm

by nexgentech | Oct 24, 2017 | ieee project

Fast Automatic Frequency Calibrator Using an Adaptive Frequency Search Algorithm Abstract: A new adaptive frequency search algorithm (A-FSA) is presented for a fast automatic frequency calibrator in wideband phase-locked loops (PLLs). The proposed A-FSA optimizes the...

An FPGA-Based Hardware Accelerator for Traffic Sign Detection

by nexgentech | Oct 24, 2017 | ieee project

An FPGA-Based Hardware Accelerator for Traffic Sign Detection Abstract: Traffic sign detection plays an important role in a number of practical applications, such as intelligent driver assistance and roadway inventory management. In order to process the large amount...

Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction

by nexgentech | Oct 24, 2017 | ieee project

Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction Abstract: During fail data collection, a tester collects information that is useful for defect diagnosis. If fail data collection can be terminated early, the tester time as well as the...
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